Focused ion beam

Results: 158



#Item
61Electron microscopy / Semiconductor device fabrication / Thin film deposition / Microtechnology / Focused ion beam / Ion beam / Microelectromechanical systems / Scanning electron microscope / Nanotechnology / Physics / Scientific method / Science

NanoTech1401002AgeevILO.fm

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Source URL: www.ntmdt.com

Language: English - Date: 2015-01-20 05:11:10
62Electron microscopy / Physics / Science / Focused ion beam / Fib / Ion beam / Semiconductor device fabrication / Thin film deposition / Scientific method

Sample Results Summary Sheet Please return this form to the Curator for each allocated Sample Sample ID: RB-QD04[removed]

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Source URL: hayabusaao.isas.jaxa.jp

Language: English - Date: 2014-12-24 00:09:03
63Chemistry / Focused ion beam / Electron microscope / Transmission electron microscopy / Scanning electron microscope / Microtome / Epoxy / Nanoparticle / Desiccator / Scientific method / Electron microscopy / Science

Sample Results Summary Sheet Please return this form to the Curator for each allocated Sample Sample ID: RA-QD02-0032

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Source URL: hayabusaao.isas.jaxa.jp

Language: English - Date: 2014-12-15 18:58:59
64Chemistry / Focused ion beam / Electron microscope / Transmission electron microscopy / Scanning electron microscope / Epoxy / Microtome / Desiccator / Nanoparticle / Electron microscopy / Scientific method / Science

RA-QD02-0032-05_06 Curation data Status Size Transfer

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Source URL: hayabusaao.isas.jaxa.jp

Language: English - Date: 2014-11-28 02:45:14
65Chemistry / Focused ion beam / Electron microscope / Transmission electron microscopy / Scanning electron microscope / Microtome / Epoxy / Nanoparticle / Desiccator / Electron microscopy / Scientific method / Science

RA-QD02[removed]Curation data Status Size Transfer

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Source URL: hayabusaao.isas.jaxa.jp

Language: English - Date: 2015-01-14 23:01:49
66Chemistry / Focused ion beam / Electron microscope / Transmission electron microscopy / Scanning electron microscope / Microtome / Epoxy / Nanoparticle / Desiccator / Scientific method / Electron microscopy / Science

Sample Results Summary Sheet Please return this form to the Curator for each allocated Sample Sample ID: RA-QD02-0032

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Source URL: hayabusaao.isas.jaxa.jp

Language: English - Date: 2014-12-15 18:58:58
67Physics / Science / Microtechnology / Electron microscopy / Focused ion beam / Ion beam / Microelectromechanical systems / Photolithography / Nanotechnology / Semiconductor device fabrication / Materials science / Thin film deposition

NanoTech1402002AgeevLO.fm

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Source URL: www.ntmdt.com

Language: English - Date: 2015-01-20 04:11:06
68Chemistry / Physics / Focused ion beam / Ion beam / Sputtering / Fib / Etching / Semiconductor device fabrication / Thin film deposition / Materials science

NanoTech1401003AgeevIILO.fm

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Source URL: www.ntmdt.com

Language: English - Date: 2015-01-20 05:00:11
69Electron microscope / Centre for Advanced Microscopy / Microscope / Microscopy / Scanning electron microscope / Transmission electron microscopy / Scanning probe microscopy / Electron backscatter diffraction / Focused ion beam / Scientific method / Science / Electron microscopy

SYDNEY AUSTRALIAN CENTRE FOR & MICROSCOPY MICROSCOPY & MICROANALYSIS

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Source URL: sydney.edu.au

Language: English - Date: 2014-06-04 22:42:49
70Chemistry / Focused ion beam / Electron microscope / Transmission electron microscopy / Scanning electron microscope / X-ray photoelectron spectroscopy / Characterization / Atomic force microscopy / Raman spectroscopy / Scientific method / Science / Electron microscopy

Automated Image Analysis Methods for Characterization and Measurement of Nanomaterials Center for Biological and Environmental Nanotechnology Rice University

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Source URL: smartimtech.com

Language: English - Date: 2006-01-31 06:16:22
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